09/01/10 FEI unveils new capabilities for natural resource extraction
FEI Company announces the availability of two new software solutions that provide quantifiable data to improve natural resource extraction. In addition, FEI announces that its popular QEMSCAN(R) software is now available on the Quanta(TM) 650 scanning electron microscope (SEM) platform. The new software upgrades are part of FEI's automated mineralogy technology suite, a high throughput analysis solution that provides quantitative mineralogical data on a wide range of geological samples...
08/05/10 FEI reports increased second-quarter bookings and earnings
FEI Company reported record second-quarter net bookings and improved gross margins compared with the first quarter of 2010 and the second quarter of 2009. Net income on the basis of accounting principles generally accepted in the United States (GAAP) was $16.2 million or $0.40 per diluted share, compared with $4.1 million or $0.11 per diluted share in the first quarter of 2010 and $3.7 million or $0.10 per diluted share in the second quarter of 2009...
08/02/10 FEI Introduces Nova NanoSEM 50 Series
FEI Company announced the availability of its new Nova(TM) NanoSEM 50 Series of ultra-high resolution scanning electron microscopes (UHR SEMs) today. It is designed to provide industry-leading, nanometer-scale resolution and ultra-precise analysis on the widest range of samples. Initial shipments are planned for the fourth quarter of this year…
08/02/10 FEI software release opens new territory for electron microscopy in life sciences
FEI Company released a set of software applications today that increase the throughput and ease-of-use of its electron microscopes for biological research. The four software packages make electron microscopes more useful for life science researchers involved in structural, cellular and tissue biology as they build the full solution from sample to biological answer...
06/29/10 FEI Commissions Titan S/TEM at Institute of Nanoscience of Aragon
FEI Company has successfully completed the installation of its Titan(TM) scanning/transmission electron microscope (S/TEM) at the Zaragoza University Institute of Nanoscience of Aragon (INA), located in Spain. By providing direct access to structural and analytical information down to the atomic level, the Titan S/TEM will play an essential role in all three of the institute's primary interest areas: the physics of nanosystems, nanobiomedicine and nanomaterials...
06/24/10 FEI Announces Completion of Bilateral Advanced Pricing Agreement Between the U.S. and the Netherlands Tax Authorities
FEI Company announced that it has received confirmation that the U.S. and Netherlands taxing authorities have entered into a mutual agreement on various transfer pricing issues with respect to FEI. FEI has been providing valuation allowance against U.S. deferred tax assets and reserves for selected tax issues as required under ASC 740 (formerly FIN 48). As a result of this agreement, FEI will release valuation allowance and tax reserves estimated at between $15 million and $32 million in the second quarter of 2010...
05/05/10 FEI Reports record for first-quarter bookings of $167.9 Million
FEI Company reports the highest first-quarter bookings in the company's history. Revenue increased compared with last year's first quarter and was in line with expectations after the effect of currency changes. Gross margin increased from the fourth quarter of 2009, and earnings were affected by previously-announced bad debt expense and restructuring charges….
05/05/10 Wageningen University Orders FEI Magellan Scanning Electron Microscope for High-Resolution Surface Imaging of Biological Materials
FEI Company today announced the sale of a Magellan(tm) extreme high-resolution scanning electron microscope (XHR SEM) to Wageningen University, The Netherlands. The Magellan is the only family of SEMs that provides high-throughput, sub-nanometer resolution at low accelerating voltages, while retaining the flexibility and ease-of-use that are characteristic of SEM technology...
05/04/10 UCLA's Dr. Hong Zhou breaks resolution barrier: achieves atomic resolution of viruses using a FEI Cryo-Electron microscope
Dr. Hong Zhou of the University of California at Los Angeles (UCLA) and the California NanoSystems Institute (CNSI) has achieved atomic resolution of viruses in solution for the first time ever recorded using a Titan Krios(TM) transmission electron microscope (TEM)..
04/26/10 FEI Announces New Flagship Helios NanoLab x50 DualBeam Series
FEI Company today introduced the new Helios NanoLab(TM) x50 DualBeam(TM) Series, the most powerful and versatile DualBeam system available on the market today. It integrates FEI's extreme high-resolution scanning electron microscope (XHR SEM) with a new, high-performance focused ion beam (FIB), to deliver an unprecedented level of imaging and milling capability for leading-edge applications in semiconductor and materials science research and development...
04/12/10 FEI Company Announces Plan to Relocate Some Manufacturing From the Netherlands to the Czech Republic
FEI Company announced plans to relocate the manufacturing of its Small DualBeam(TM) product line from Eindhoven, the Netherlands to its facility in Brno, Czech Republic. The move is expected to take approximately nine months and involves products with approximately $60 million in annual revenue, or approximately 10 percent of the company's total revenue. …
03/03/10 FEI Completes Multiple System Installation at New Materials Ageing Institute Research Center in France
FEI Company announces the completion of a multiple system installation at the Materials Ageing Institute (MAI) in France, a utility-oriented research center financed by Electricité de France (EDF), the Tokyo Electric Power Company (TEPCO), the Kansai Electric Power Company (KEPCO) and the US Electric Power Research Institute (EPRI). ...
11/03/09 FEI Sells Phenom(TM) Product Line
FEI Company announces that Phenom-World, a majority-owned subsidiary of NTS Group B.V. (NTS) of Eindhoven, The Netherlands, has acquired FEI's Phenom(TM) product line. ...
09/02/09 FEI Introduces New Solution for Gunshot Residue Analysis in Forensics
FEI Company announces the release of two dedicated scanning electron microscopes (SEMs) and a new software package for automated analysis of gunshot residues (GSR). ...
07/27/09 FEI Takes Ultimate Performance to New Limits With New Titan G2 S/TEM Family
FEI Company announces the release of the Titan(tm) G2 scanning/transmission electron microscope (S/TEM) Family, inaugurating the second generation of the company's revolutionary Titan platform -- the world's most powerful commercially-available microscope. ...
07/27/09 FEI's New Direct Electron Detector Revolutionizes Electron Microscopy of Biological and Other Beam-Sensitive Samples
FEI Company announces the new Falcon(tm) Direct Electron Detector for its Titan(tm) and Tecnai(tm) transmission electron microscopes (TEMs). ...
07/20/09 FEI's New Tecnai Osiris Transmission Electron Microscope Sets New Standards for Speed in Analytics
FEI Company announces the release of the Tecnai Osiris(tm) scanning/transmission electron microscope (S/TEM), delivering revolutionary analytical speed and performance. ...
07/13/09 FEI Announces New Helios NanoLab 1200 Full Wafer DualBeam Solution
FEI Company announces the newest member of the Helios NanoLab(tm) family -- the Helios NanoLab 1200 Full Wafer DualBeam(tm) system. ...
03/31/09 FEI Introduces the Fibermetric System for Automated Measurement and Analysis of Micro- and Nano-Fibers
FEI announces the Fibermetric(TM) system powered by the Phenom(TM) personal electron microscope. ...
11/01/07 FEI Phenom Demo
FEI's new Phenom microscope is demonstrated.
